The ATDP suite structure for adaptive testing of electronic system states

12th International Conference Microwave and Telecommunication Technology Pub Date : 2002-09-09 DOI:10.1109/CRMICO.2002.1137329

I. Magda, A. Pashchenko, I. Shapoval, V. Novikov

引用次数: 1

Abstract

The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.

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用于电子系统状态自适应测试的ATDP套件结构

介绍了自适应测试与数据处理软件套件(ATDP套件)的结构和特点。该方法适用于非线性、不稳定电子系统的实验时间序列动态特性恢复。演示了在ATDP套件中实现的基本方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

12th International Conference Microwave and Telecommunication Technology

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