An experiment study on AC conductivity of conductive ink film at microwave X-band

Abstract

Utilizing the transmission /reflection measurement method, we investigated the complex conductivity of conductive ink films at microwave X-band. The results show that the frequency dependence of the complex conductivity is in good agreement with the Drude model. However, the retrieved plasmon frequency ωp and the collision frequency Wt are much lower than those of metal materials. The effect of surface morphology of the films on complex conductivity was investigated. The study provides a solid foundation for the applications of conductive ink films, such as wideband absorber designs.