Area-driven partial reconfiguration for SEU mitigation on SRAM-based FPGAs

M. Vavouras, C. Bouganis
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引用次数: 2

Abstract

This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on partial reconfiguration for Single Event Upset (SEU) mitigation. The proposed method is compared with existing techniques such as blind and on-demand scrubbing on a novel SEU mitigation framework implemented on the ZYNQ platform, supporting various SEU and scrubbing rates. A design space exploration on the availability versus data transfers from a Double Data Rate Type 3 (DDR3) memory, shows that our approach outperforms blind scrubbing for a range of availability values when a second order polynomial IP is targeted. A comparison to an existing on-demand scrubbing technique based on Dual Modular Redundancy (DMR) shows that our approach saves up to 46% area for the same case study.
基于sram的fpga的区域驱动部分重构
提出了一种基于局部重构的区域驱动现场可编程门阵列(FPGA)擦洗技术,用于缓解单事件干扰(SEU)。在ZYNQ平台上实现了一个新的SEU缓解框架,支持不同的SEU和洗涤速率,并将所提出的方法与现有的盲法和按需洗涤等技术进行了比较。对可用性与双数据速率类型3 (DDR3)内存的数据传输的设计空间探索表明,当目标是二阶多项式IP时,我们的方法在可用性值范围内优于盲擦洗。与现有的基于双模冗余(DMR)的按需洗涤技术相比,我们的方法在相同的案例研究中节省了高达46%的面积。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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