Ray Tracing Rational B-Spline Patches in VLSI

Bengt-Olaf Schneider
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引用次数: 6

Abstract

Rational B-spline surfaces make it possible to merge the concepts of freeform surfaces and that of surfaces described by rational polynomials especially conic sections. For ray tracing it is crucial to determine the intersection between ray and object. Therefore an algorithm is developed that is suitable for a VLSI implementation. Some alternatives for the implementation of this algorithm are presented and discussed. The paper concludes with a discussion of some problems and possible further developments.
VLSI中光线追踪的有理b样条补丁
有理b样条曲面使自由曲面的概念与有理多项式(尤其是圆锥截面)所描述的曲面的概念合并成为可能。对于光线追踪来说,确定光线与物体的交点是至关重要的。因此,本文提出了一种适合VLSI实现的算法。提出并讨论了实现该算法的几种备选方案。文章最后讨论了一些问题和可能的进一步发展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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