Modeling of thermal processes in the microcontroller system using fractional order transfer function

Abstract

The paper proposes new, fractional order models describing thermal processes in working microcontroller system. The proposed models have the form of the fractional order transfer function with delay. Their parameters are identified by minimization of the MSE cost function, describing difference between step response of a model and real experimental system. The step responses of the models are expressed by analytical formulae. Temperature of the tested system is measured by a thermal camera. The proposed FO models with delay are more accurate in the sense of MSE cost function than known Kupfmüller model.