Transistor Test-Fixture with Biasing for Millimeter-Wave Noise Measurement

Abstract

Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.