Fast Eye Diagram Simulation based on Latency Insertion Method

Abstract

Eye diagrams are used to assess the quality of high-speed channels. They are thus very important for signal integrity analysis. The voltage-in-current latency insertion method (VinC LIM) is a fast transient circuit simulation algorithm with superior stability properties. In this paper, VinC LIM is proven to be reliable for fast transient simulation of eye diagrams. The results and speed are compared with the transient simulation and channel simulation of commercial platforms.