{"title":"High power ultra wide band and vircator source-victim experiments","authors":"D. Åberg, F. Olsson, M. Jansson, C. Lindskog","doi":"10.1109/EMCEUROPE.2008.4786910","DOIUrl":null,"url":null,"abstract":"This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.