Spatial coherency of the synchrotron radiation at the visible light region and its application for the electron beam profile measurement

Abstract

Spatial coherences of SR beam at visible light region were measured both /spl sigma/ and /spl pi/-polarized components at Photon Factory. A wave-front division type polarized interferometer was designed and constructed for this experiment. Interferograms were observed clearly in the vertical direction. /spl pi/ phase difference of the interference fringe was observed between interferograms corresponding to /spl sigma/ and /spl pi/-polarized components. Degree of spatial coherence was measured and by means of the van Citterut-Zernike's theorem, a vertical beam profile was obtained by the Fourier transform of the degree of spatial coherence.