On Benchmarking Pin Access for Nanotechnology Standard Cells

Shang-Rong Fang, Cheng-Wei Tai, Rung-Bin Lin
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引用次数: 5

Abstract

This article investigates pin accessibility problem of standard cells designed with a sub-20nm technology. The 15nm open cell library from NanGate and three of its variants with a reduced number of access points per pin based on FreePDK15 are used for our study. Our experiments show that a standard cell library is viable when the number of access points per pin is not less than three.
纳米技术标准电池引脚通路的基准测试
本文研究了采用亚20nm工艺设计的标准电池的引脚可及性问题。我们的研究使用了NanGate的15nm开放单元库及其三个变体,这些变体基于FreePDK15,减少了每个引脚的接入点数量。我们的实验表明,当每个引脚的接入点数量不少于三个时,标准单元库是可行的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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