Influence of rapid thermal annealing on the molecular structure of PEDOT-PSS thin films

2009 IEEE LEOS Annual Meeting Conference Proceedings Pub Date : 2009-12-01 DOI:10.1109/LEOS.2009.5343084

Antje Schaarschmidt, A. Farah, Arun Aby, Amr S. Helmy

引用次数: 1

Abstract

The effect of rapid thermal annealing on PEDOT-PSS films has been investigated by Raman spectroscopy. The analysis indicates the formation of an annealing-induced doping in the PEDOT structure, suggesting a modification of the electronic structure.

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快速热处理对PEDOT-PSS薄膜分子结构的影响

利用拉曼光谱研究了快速退火对PEDOT-PSS薄膜的影响。分析表明在PEDOT结构中形成了退火诱导的掺杂，表明电子结构发生了改变。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2009 IEEE LEOS Annual Meeting Conference Proceedings

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