Testability and test architectures

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology' Pub Date : 1988-03-21 DOI:10.1109/REG5.1988.15922

M. Hare, S. Sicola

引用次数: 3

Abstract

The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<>

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可测试性和测试架构

作者定义了可测试性，并描述了在产品中包含可测试性所带来的好处。介绍了关于可测试性的神话。本文描述了有助于最大化成功实现测试目标的机会，同时最小化硬件和软件成本的测试架构。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'

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