Novel measurement system within 110-170 GHz using a dielectric multistate refiectometer

Abstract

The paper will describe a novel measurement system which is part of a research project on the design of M3ICs at 140 GHz. The intension is to characterise on-wafer devices within the waveguide band 110 - 170 GHz using a dielectric waveguide multistate reflectometer (DMR). Although a lot of work has been done in recent years on realising 6 port and then 4 port reflectometers they either were built for frequency ranges below 100 GHz or they were realised using metallic waveguide technology.