A Method for Longevity Function Prediction of Electronic Components with Finite Difference Method

Abstract

In this paper, a method is established, using finite difference method, to predict the longevity function. This method can effectively deal with non-linear, shock, non-convergence data. The method can get a longevity function by poly-fitting the data, in the situation that common fitting method cannot work well. The result of one experiment is used as an example, in which the data are analyzed and fitted to establish a feasible longevity function., which has 90% conformity. The method can also be widely used and extension in other fields when analyzing the non-linear data.