J. Bulzacchelli, T. Beukema, D. Storaska, Ping-Hsuan Hsieh, S. Rylov, Daniel Furrer, Daniele Gardellini, A. Prati, C. Menolfi, D. Hanson, J. Hertle, T. Morf, Vivek Sharma, R. Kelkar, H. Ainspan, W. Kelly, G. Ritter, Jon Garlett, R. Callan, T. Toifl, D. Friedman
{"title":"A 28Gb/s 4-tap FFE/15-tap DFE serial link transceiver in 32nm SOI CMOS technology","authors":"J. Bulzacchelli, T. Beukema, D. Storaska, Ping-Hsuan Hsieh, S. Rylov, Daniel Furrer, Daniele Gardellini, A. Prati, C. Menolfi, D. Hanson, J. Hertle, T. Morf, Vivek Sharma, R. Kelkar, H. Ainspan, W. Kelly, G. Ritter, Jon Garlett, R. Callan, T. Toifl, D. Friedman","doi":"10.1109/ISSCC.2012.6177031","DOIUrl":null,"url":null,"abstract":"As exemplified by standards such as OIF CEI-25G, 32G-FC, and next-generation 100GbE, serial link data rates are being pushed up to 25 to 28Gb/s in order to increase I/O system bandwidth. Such speeds represent a near doubling of the state-of-the-art for fully integrated transceivers [1-3]. With scaling no longer providing large gains in device speed, significant design advances must be made to attain these data rates. This paper describes a 28Gb/s serial link transceiver featuring a source-series terminated (SST) driver topology with twice the speed of existing designs, a two-stage peaking amplifier with capacitively-coupled parallel input stages and active feedback, and a 15-tap DFE. The use of capacitive level-shifters allows a single current-integrating summer to drive the parallel paths used for speculating the first two DFE taps.","PeriodicalId":255282,"journal":{"name":"2012 IEEE International Solid-State Circuits Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"60","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2012.6177031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 60
Abstract
As exemplified by standards such as OIF CEI-25G, 32G-FC, and next-generation 100GbE, serial link data rates are being pushed up to 25 to 28Gb/s in order to increase I/O system bandwidth. Such speeds represent a near doubling of the state-of-the-art for fully integrated transceivers [1-3]. With scaling no longer providing large gains in device speed, significant design advances must be made to attain these data rates. This paper describes a 28Gb/s serial link transceiver featuring a source-series terminated (SST) driver topology with twice the speed of existing designs, a two-stage peaking amplifier with capacitively-coupled parallel input stages and active feedback, and a 15-tap DFE. The use of capacitive level-shifters allows a single current-integrating summer to drive the parallel paths used for speculating the first two DFE taps.