STUDY OF THIN FILMS AND AQUEOUS CHLORINE SOLUTION USING X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY

Abstract

The capability of thin film measurement and performance at low energy using XAFS at the X-ray demonstration and development beamline (XDD) at SSLS has been explored. XDD is supplied with synchrotron radiation from one of the two superconducting dipoles of the Helios 2 storage ring. The photon energy is tunable from 2.5 keV to 10 keV using a channel-cut Si(111) monochromator and the photon flux is of the order of 109 photons/s at energies of several keV. The energy resolution, detector, and control system required by XAFS were optimized. As a demonstration, the XAFS spectra of Mn-doped ZnO thin films at Mn K-edge and chlorine aqueous solution at Cl K-edge were measured and discussed.