{"title":"Basics and Current Aspects of Scanning Electron Microscopy","authors":"H. Stegmann","doi":"10.31399/asm.cp.istfa2021tpk1","DOIUrl":null,"url":null,"abstract":"\n Presentation slides from the ISTFA 2021 tutorial, “[Basics and Current Aspects of Scanning Electron Microscopy].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2021tpk1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Presentation slides from the ISTFA 2021 tutorial, “[Basics and Current Aspects of Scanning Electron Microscopy].”