S-Parameter Extraction Methodology in FDTD for Nano-Scale Optical Interconnects

Abstract

We propose a methodology for extracting scattering parameters of optical interconnects comprised of dielectric slab waveguides. The proposed methodology is demonstrated by calculating the TE mode attenuation and phase delay of an example dielectric slab in 2D FDTD. Results show good correlation between the proposed FDTD-based methodology and analytic solutions. Work is currently under way to extend the proposed methodology to dielectric waveguides exhibiting stochastic surface roughness.