The research of characteristics of multichannel GaAs detectors

Abstract

In this paper the results of multichannel GaAs detectors testing in integral mode are presented. It is shown that for x-ray quanta at the energy range 40–75 keV and exposure dose more than 1,5 mR the noise characteristics of the detectors are mostly depends on photon noise. It is experimentally proved that negative potential on irradiated contact and an inclination of detectors at a small angle to a direction of falling of radiation allow to increase sensitivity of detectors considerably.