Millimetre wave dielectric chartacterisation of multilayer LTCC substrate

Abstract

The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz - 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.