Growth of gallium antimonide (GaSb) by metalorganic chemical vapour deposition

A. Subekti, E. Goldys, T. Tansley
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引用次数: 3

Abstract

Growth of unintentionally doped GaSb by atmospheric pressure MOCVD using Trimethylgallium (TMGa) and Trimethylantimonide (TMSb) on various substrate is investigated. Optimum growth temperature and the V/III ratio window is given with respect to hole density, mobility and optical properties. The optimum growth rate was found to be 2.2 /spl mu/m/h with good surface morphology for samples grown at 500-540/spl deg/C and V/III ratio approximately equal to unity. The as grown samples are p-type, having room-temperature mobility and hole density at the optimum growth condition as above, of 500 cm/sup 2/ V/sup -1/ s/sup -1/ and 0.5-3.0/spl times/10/sup 17/ cm/sup -3/, respectively. The fundamental absorption band edge of grown layers in transmission spectra shows clear excitonic features at low temperatures. Very short growth time leads to quantum dot formation with the best quantum dots grown on Ge.
金属有机化学气相沉积法生长锑化镓(GaSb)
研究了三甲基镓(TMGa)和三甲基锑(TMSb)在不同衬底上的常压MOCVD生长非故意掺杂GaSb。给出了与空穴密度、迁移率和光学性质相关的最佳生长温度和V/III比窗口。在500 ~ 540℃/spl℃、V/III比近似等于1的条件下生长,最佳生长速率为2.2 /spl mu/m/h,表面形貌良好。生长后的样品为p型,其室温迁移率为500 cm/sup 2/ V/sup -1/ s/sup -1/,空穴密度为0.5 ~ 3.0/spl倍/10/sup 17/ cm/sup -3/。透射光谱中生长层的基本吸收带边缘在低温下表现出明显的激子特征。极短的生长时间可以形成量子点,在Ge上生长的量子点效果最好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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