Novel Perspective Approach to Improve Performance of Nanowire TFET

Ritwik Sharma, D. Yadav, Sachin Kumar, Nitish Parmar, Somya Saraswat, Atul Kumar
{"title":"Novel Perspective Approach to Improve Performance of Nanowire TFET","authors":"Ritwik Sharma, D. Yadav, Sachin Kumar, Nitish Parmar, Somya Saraswat, Atul Kumar","doi":"10.1109/SCEECS48394.2020.113","DOIUrl":null,"url":null,"abstract":"A Nanowire TFET device employing a Dual Metal Gate along with a combination of lower energy band gap III- V material for the source and Doping Pockets around the SC- junction to boost On-current is proposed. Gaussian Doping is exploited on the Drain side suppressing the ambi-polar and off-state currents. The proposed device (DMG DP GaSb-Si NWTFET) is judged against a vanilla Silicon Nanowire TFET (Si- NWTFET). Both these TFET devices are analyzed for their DC and Analog Characteristics. The modified device exhibits a much superior ON-current, OFF-current and Subthreshold Slope (SS) along with improvements in trans-conductance (gm), parasitic capacitance, Cutoff frequency (fT), transmit time (td) and the Gain-Bandwidth Product. The improved device is optimized for gate metal workfunctions and Pocket Doping Concentrations. The device is proposed as a suitable replacement to CMOS for low power applications.","PeriodicalId":167175,"journal":{"name":"2020 IEEE International Students' Conference on Electrical,Electronics and Computer Science (SCEECS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Students' Conference on Electrical,Electronics and Computer Science (SCEECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SCEECS48394.2020.113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

A Nanowire TFET device employing a Dual Metal Gate along with a combination of lower energy band gap III- V material for the source and Doping Pockets around the SC- junction to boost On-current is proposed. Gaussian Doping is exploited on the Drain side suppressing the ambi-polar and off-state currents. The proposed device (DMG DP GaSb-Si NWTFET) is judged against a vanilla Silicon Nanowire TFET (Si- NWTFET). Both these TFET devices are analyzed for their DC and Analog Characteristics. The modified device exhibits a much superior ON-current, OFF-current and Subthreshold Slope (SS) along with improvements in trans-conductance (gm), parasitic capacitance, Cutoff frequency (fT), transmit time (td) and the Gain-Bandwidth Product. The improved device is optimized for gate metal workfunctions and Pocket Doping Concentrations. The device is proposed as a suitable replacement to CMOS for low power applications.
提高纳米线TFET性能的新方法
提出了一种采用双金属栅极以及低能带隙III- V材料作为源器件和SC结周围掺杂袋的纳米线TFET器件,以增强导通电流。在漏极侧利用高斯掺杂抑制双极性和失态电流。所提出的器件(DMG DP GaSb-Si NWTFET)与普通硅纳米线TFET (Si- NWTFET)进行了对比。分析了这两种器件的直流特性和模拟特性。改进后的器件具有优异的通断电流、关断电流和亚阈值斜率(SS),并改善了跨导(gm)、寄生电容、截止频率(fT)、传输时间(td)和增益带宽积。改进后的装置对栅极金属工作功能和口袋掺杂浓度进行了优化。该器件被认为是低功耗应用中CMOS的合适替代品。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信