Characterisation of nanostructures via terahertz spectroscopy

2010 Conference on Optoelectronic and Microelectronic Materials and Devices Pub Date : 2010-12-01 DOI:10.1109/COMMAD.2010.5699756

P. Parkinson, H. Joyce, X. Xu, Q. Gao, H. Tan, C. Jagadish, L. Herz, M. Johnston

引用次数: 1

Abstract

We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes.

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纳米结构的太赫兹光谱表征

我们已经使用太赫兹光谱学来测量一系列半导体纳米结构的电导率和时间分辨光电导率。本文主要介绍了我们最近在半导体纳米线和单壁碳纳米管上的太赫兹电导率研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2010 Conference on Optoelectronic and Microelectronic Materials and Devices

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