The Algorithm of Testing ADC Effective, Number of Bits Based on Hilbert and Wavelet Transform

Abstract

In today advanced digital signal processing, many parameters must be tested to evaluate the accuracy performance of system output. Therefore, focusing down into an essential part of signal converts (Analog to Digital Converts) is a must prior to any system evaluations. As a result, this work will emphasize on the testing enhancement of Analog to Digital Converts parameters, such as Effected Number of Bits, to determine the accuracy of waveform regeneration and device performance with a newly implemented algorithm. That is, a new algorithm based on structuring Discrete Wavelet transform decomposition on prior interleave Hilbert transform, of Analog to Digital Converts output waveform, to measure Converts ability to reproduce a waveform in their full capacity. With such arrangement, the new algorithm intends to improve previous work for the testing process, higher testing accuracy, fewer computation data samples, and provide a platform of modulation process for other parameters measurement at the same time.