Scalable and Configurable Multi-Chip SRAM in a Package for Space Applications

A. Simevski, Patryk Skoncej, C. Calligaro, M. Krstic
{"title":"Scalable and Configurable Multi-Chip SRAM in a Package for Space Applications","authors":"A. Simevski, Patryk Skoncej, C. Calligaro, M. Krstic","doi":"10.1109/DFT.2019.8875489","DOIUrl":null,"url":null,"abstract":"Space applications constantly require integration of more processing capabilities and greater memory capacity, at reduced weight and power consumption. The IHP 130 nm technology is a commercially-qualified and radiation-assessed technology which is sufficiently aggressive for the conservative approach in the space area. In this process node we realize a rad-hard 16Mbit Multi-Chip Module (MCM) SRAM with improved characteristics in comparison to competitor SRAMs. Moreover, the real novelty is the scalable master-slave architecture of the System-in-Package (SiP) with Error Detection and Correction (EDAC), and scrubbing mechanisms which are now at the SiP level. Furthermore, the width of the word size is configurable. On the other side, we conduct a large number of fault injection campaigns in order to early investigate the SiP reliability. High error resilience and significantly reduced number of interrupt requests for error recovery are observed.","PeriodicalId":415648,"journal":{"name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"378 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2019.8875489","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Space applications constantly require integration of more processing capabilities and greater memory capacity, at reduced weight and power consumption. The IHP 130 nm technology is a commercially-qualified and radiation-assessed technology which is sufficiently aggressive for the conservative approach in the space area. In this process node we realize a rad-hard 16Mbit Multi-Chip Module (MCM) SRAM with improved characteristics in comparison to competitor SRAMs. Moreover, the real novelty is the scalable master-slave architecture of the System-in-Package (SiP) with Error Detection and Correction (EDAC), and scrubbing mechanisms which are now at the SiP level. Furthermore, the width of the word size is configurable. On the other side, we conduct a large number of fault injection campaigns in order to early investigate the SiP reliability. High error resilience and significantly reduced number of interrupt requests for error recovery are observed.
用于空间应用的可扩展和可配置多芯片SRAM封装
空间应用不断需要集成更多的处理能力和更大的存储容量,同时减少重量和功耗。IHP 130纳米技术是一种商业认证和辐射评估技术,对于空间领域的保守方法来说,它是足够积极的。在这个工艺节点上,我们实现了一个硬16Mbit多芯片模块(MCM) SRAM,与竞争对手的SRAM相比,它的性能有所提高。此外,真正的新奇之处在于具有错误检测和纠正(EDAC)的系统级包(SiP)的可伸缩主从架构,以及现在处于SiP级别的清除机制。此外,字长的宽度是可配置的。另一方面,为了早期研究SiP可靠性,我们进行了大量的故障注入活动。高错误恢复能力和显著减少中断请求的错误恢复数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信