Post patterning meso porosity creation: a potential solution for pore sealing

R. Caluwaerts, M. Van Hove, G. Beyer, R. Hoofman, H. Struyf, G. Verheyden, J. Waeterloos, Z. Tokei, F. Iacopi, L. Carbonell, Q. Le, A. Das, I. Vos, S. Demuynck, K. Maex
{"title":"Post patterning meso porosity creation: a potential solution for pore sealing","authors":"R. Caluwaerts, M. Van Hove, G. Beyer, R. Hoofman, H. Struyf, G. Verheyden, J. Waeterloos, Z. Tokei, F. Iacopi, L. Carbonell, Q. Le, A. Das, I. Vos, S. Demuynck, K. Maex","doi":"10.1109/IITC.2003.1219765","DOIUrl":null,"url":null,"abstract":"The creation of meso porosity in single damascene structures after patterning has been investigated to facilitate the sealing of the sidewalls by iPVD barriers. The dielectric stack consists of developmental porous SILK (v7) resin (SiLK is a trademark of The Dow Chemical Company) and a chemical vapor deposited hard mask. Porous SILK (v7) resin was selected since the temperature of vitrification of the material is lower than the temperature of porogen burn out. Creation of meso porosity after patterning results in smooth trench sidewalls, leading to an improved iPVD barrier integrity, as opposed to the conventional process sequence, which gives rise to large, exposed pores at the sidewall.","PeriodicalId":212619,"journal":{"name":"Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695)","volume":"169 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IITC.2003.1219765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

The creation of meso porosity in single damascene structures after patterning has been investigated to facilitate the sealing of the sidewalls by iPVD barriers. The dielectric stack consists of developmental porous SILK (v7) resin (SiLK is a trademark of The Dow Chemical Company) and a chemical vapor deposited hard mask. Porous SILK (v7) resin was selected since the temperature of vitrification of the material is lower than the temperature of porogen burn out. Creation of meso porosity after patterning results in smooth trench sidewalls, leading to an improved iPVD barrier integrity, as opposed to the conventional process sequence, which gives rise to large, exposed pores at the sidewall.
后成型细观孔隙形成:一种潜在的孔隙密封解决方案
研究人员还研究了在形成图案后,在单一的damascene结构中产生细观孔隙,以促进iPVD屏障对侧壁的密封。电介质堆叠由发育多孔的SILK (v7)树脂(SILK是陶氏化学公司的商标)和化学气相沉积的硬掩膜组成。选用多孔SILK (v7)树脂,因为材料的玻璃化温度低于孔隙烧出温度。图案化后产生的细观孔隙形成了光滑的沟槽侧壁,从而提高了iPVD屏障的完整性,而传统的工艺顺序会在侧壁产生大的、暴露的孔隙。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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