The Eccentrics of CPU FIVR AGS supply noise debug and learnings

Druvika Pandita, Veerendra K Jonna, Kim Meng Chin, Muzammil Peerjade, A. Singh, Anil Bindu Lingambudi
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引用次数: 0

Abstract

SoC design, validation, and manufacturing teams all need to work in tandem to ensure a successful product is released to the market. Pre-silicon and post-silicon validation is critical and is performed to ensure minimal Si re-spins at the fabrication and avoid any design bugs reaching the end customer. The post-silicon debug of various power failures issues related to analog supply exhibiting random signatures induced learnings that can help expedite changes in post-Si validation and high-volume screening, Discussed in detail are the debug efforts to identify one of the many Analog Generation Supply (AGS) noise failure and isolation. The paper elucidates reports of the proposed defects and their various bearings, issue root causes, and issue validation suite formation.
CPU FIVR AGS的偏心提供了噪声调试和学习
SoC设计、验证和制造团队都需要协同工作,以确保成功的产品发布到市场上。预硅和后硅验证是至关重要的,并执行以确保在制造时最小的硅再旋转,并避免任何设计错误到达最终客户。与模拟电源相关的各种电源故障的后硅调试显示随机签名诱导学习,可以帮助加快后硅验证和大批量筛选的变化,详细讨论了调试工作,以确定许多模拟生成电源(AGS)噪声故障和隔离之一。这篇论文阐明了被提议的缺陷的报告和它们的各种轴承,问题的根本原因,以及问题验证套件的形成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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