The effect of electrode size on memristor properties: An experimental and theoretical study

E. Gale, B. D. L. Costello, A. Adamatzky
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引用次数: 17

Abstract

The width of the electrodes is not included in the current phenomenological models of memristance, but is included in the memory-conservation (mem-con) theory of memristance. An experimental study of the effect of changing the top electrode width was performed on titanium dioxide sol-gel memristors. It was demonstrated that both the on resistance, Ron, and the off resistance, Roff, decreased with increasing electrode size. The memory function part of the mem-con model could fit the relationship between Ron and electrode size. Similarly, the conservation function fits the change in Roff, The experimentally measured hysteresis did not fit the phenomenological model's predictions. Instead the size of the hysteresis increased with increasing electrode size, and correlated well to decreasing Ron.
电极尺寸对忆阻器性能影响的实验与理论研究
电极的宽度不包括在目前的忆阻现象模型中,但包括在记忆守恒(memm -con)理论中。实验研究了改变顶电极宽度对二氧化钛溶胶-凝胶记忆电阻器的影响。结果表明,导通电阻Ron和关断电阻Roff随电极尺寸的增大而减小。memm -con模型的记忆功能部分可以拟合Ron与电极尺寸之间的关系。同样,守恒函数也符合Roff的变化,实验测量的迟滞不符合现象学模型的预测。相反,滞后的大小随着电极尺寸的增加而增加,并且与Ron的减小相关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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