Near field measurement for EMC validation of electronics board in IMA

Abstract

Today the electronic embedded architecture in aircraft is based on traditional approaches on the independent aircraft systems with modules called LRU, Line Replaceable Unit. Needs to reduce cost and weight of the embedded electronic units pass by the implementation of a more modular electronics in the architectures AC with elementary module. Such EMC avionic tests description at electronics modules levels are not defined today. The objectives of those studies are to give technical data to defined EMC test setup and associated limits at modules levels to respect environment requirements.