Structure and band gap tuning of transparent (Ba1−xSrx)SnO3 thin films epitaxially grown on MgO substrates

Qinzhuang Liu, Bing Li, Jianjun Liu, Hong Li, Zhongliang Liu, Kai Dai, Guangping Zhu, Peng Zhang, Feng Chen, J. Dai
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引用次数: 34

Abstract

(Ba1-xSrx)SnO3 (x=0–1) (BSSO) films were epitaxially grown on MgO substrates by pulsed laser deposition. X-ray diffraction, atomic force microcopy, and optical transmittance investigations reveal that the lattice and band structure properties of the BSSO films can be modified significantly by changing the Sr content. With increasing Sr content from 0 to 1 in films, the lattice parameters decrease from 4.123 to 4.037 Å gradually, while the optical band gaps energy increases from 3.50 to 4.27 eV linearly, which was attributed to the octahedral tilting distortion pushing up the minimum of conduction band. This large structure and band gap tuning of BSSO films are promising for desired applications in the thin-film architecture.
MgO衬底外延生长透明(Ba1−xSrx)SnO3薄膜的结构和带隙调谐
采用脉冲激光沉积技术在MgO衬底上外延生长出(Ba1-xSrx)SnO3 (x= 0-1) (BSSO)薄膜。x射线衍射、原子力显微和透射率研究表明,改变Sr含量可以显著改变BSSO薄膜的晶格和能带结构。随着薄膜中Sr含量从0增加到1,晶格参数从4.123逐渐减小到4.037 Å,而光学带隙能量从3.50线性增加到4.27 eV,这是由于八面体倾斜畸变推高了导带的最小值。BSSO薄膜的这种大结构和带隙调谐在薄膜结构中有很好的应用前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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