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BAT Framework Modeling of Dimension Scaling in FinFETs and GAA-SNS FETs

Recent Advances in PMOS Negative Bias Temperature Instability Pub Date : 2021-11-26 DOI:10.1007/978-981-16-6120-4_13
Souvik Mahapatra, N. Parihar, N. Choudhury, R. Tiwari, Tarun Samadder
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finfet和GAA-SNS fet尺寸缩放的BAT框架建模
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Recent Advances in PMOS Negative Bias Temperature Instability
Recent Advances in PMOS Negative Bias Temperature Instability
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