Evaluation for Micro Surface Topography Based on Multi-fractal Spectrum

M. Chui, Youqian Feng, Wei Wang, P. Li, Xiaodong Xu
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引用次数: 1

Abstract

Aiming at the deficiency of traditional method in evaluating micro surface topography, an evaluation method is advanced based on multi-fractal spectrum. In this method, the probability measure of the gray image of micro surface topography is counted in the improved box-counting method, and the multi-fractal spectrums are extracted by the Legendre transformation of scale exponent. Based on the multi-fractal spectrum, the spectrum width, height interval and asymmetry degree are extracted, and micro surface topography are evaluated according to the parameters. Evaluation experiments of surface topographies are carried out to prove the value of multi-fractal spectrums, and the result shows that multi-fractal spectrum can overcome the deficiency of traditional method, and surface topography can be evaluated accurately by its parameters.
基于多重分形谱的微表面形貌评价
针对传统表面形貌评价方法的不足,提出了一种基于多重分形谱的表面形貌评价方法。该方法采用改进的盒计数法对微表面形貌灰度图像的概率测度进行计数,并采用尺度指数的勒让德变换提取多重分形谱。在多重分形谱的基础上,提取谱宽、高度间隔和不对称程度,并根据参数对微表面形貌进行评价。通过对表面形貌的评价实验,验证了多重分形谱的价值,结果表明多重分形谱可以克服传统方法的不足,利用其参数对表面形貌进行准确的评价。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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