An Automated System for De-Embedded Measurements of Noise and Gain Parameters

Abstract

This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.