Wideband microwave pulsed reflectometer using a six-port junction

Abstract

A six-port reflectometer technique is extended to make pulsed-RF measurements. It is shown that a time resolution of the order of 1 mu s is possible in both repetitive and single-shot mode of operation. A proof of principle of the method is obtained using passive and active loads. A simple method for the linearization of diode detector response is also presented. Because of its good time resolution, the proposed technique can be used to study thermal effects in high-power solid-state amplifiers or to characterize pulse devices used in phased-array radars.<>