{"title":"SEE Test Results for P2020 and P5020 Freescale Processors","authors":"S. Guertin, Mehran Amrbar","doi":"10.1109/REDW.2014.7004587","DOIUrl":null,"url":null,"abstract":"Freescale processors are tested for heavy ion and proton SEE. The P2020 is tested for cache and register bit upsets as well as for upsets of various algorithms and memory controller upsets. The P5020 is tested for cache and register bit upsets as well as memory controller upsets. Effectiveness of testing various algorithms is limited to proton testing of the P2020 and is generally limited in fidelity due to register and cache upsets.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2014.7004587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Freescale processors are tested for heavy ion and proton SEE. The P2020 is tested for cache and register bit upsets as well as for upsets of various algorithms and memory controller upsets. The P5020 is tested for cache and register bit upsets as well as memory controller upsets. Effectiveness of testing various algorithms is limited to proton testing of the P2020 and is generally limited in fidelity due to register and cache upsets.