Exciton-exciton annihilation in polysilanes

Abstract

We have measured the exciton--exciton annihilation rate constant for singlet excitons in solid films of poly(n-propyl methyl silane constant was determined by measuring the fluorescent intensity form films as a function of incident light intensity in two types of experiments: one in which the excitons were created by single photon transition and one in which the excitons were created by two photon transitions. The rate constant was found to be about 1 /times/ 10/sup /minus/7/cm/sup 3/s/sup /minus/1/. 14 refs., 2 figs.