An efficient algorithm to partition the combinational circuits for pseudoexhaustive testing

M. El-Mahlawy, W. Waller
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引用次数: 8

Abstract

We have presented an efficient algorithm to partition the combinational circuits for built-in pseudoexhaustive self-testing of VLSI circuits. The partitioning procedure is based on several heuristics that enable the procedure to overcome the unexpected results of the greedy heuristic procedure.
伪穷举测试中组合电路划分的一种有效算法
提出了一种有效的组合电路划分算法,用于VLSI电路的内建伪穷举自测试。划分过程基于几种启发式方法,使划分过程能够克服贪心启发式过程的意外结果。
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