{"title":"Evolution of combinatorial and sequential online self-diagnosing hardware","authors":"Miguel Garvie, A. Thompson","doi":"10.1109/EH.2003.1217663","DOIUrl":null,"url":null,"abstract":"The evolution of circuits with online built-in self-test is attempted in simulation for a full adder, two-bit multiplier and edge triggered D-latch. Results show that the evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.","PeriodicalId":134823,"journal":{"name":"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EH.2003.1217663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
The evolution of circuits with online built-in self-test is attempted in simulation for a full adder, two-bit multiplier and edge triggered D-latch. Results show that the evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.