Reliability of 28nm embedded RRAM for consumer and industrial products

Abstract

We discuss high statistic reliability data of embedded RRAM in a 28nm advanced logic foundry process coming from test devices and first products to demonstrate the matureness und usability of the embedded emerging memory for consumer and industrial products. We compare failure modes and counter measures with embedded flash from the previous generations. Overall, 28nm-embedded RRAM is an adequate successor of embedded flash.