The effect of positive polarization on grid growth, cell performance and life-'Willihnganz revisited-20 years' later'

W. Brecht, D. Feder, J. McAndrews, A. J. Williamson
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引用次数: 13

Abstract

Using ultrasonic reflection techniques to measure grid growth, carefully fabricated lead-acid telecommunication cells were tested at 160 degrees F over a wide range of positive polarizations (0-150 mV). It is shown that minimal plate growth occurs at 40 mV rather than at 70-80 mV, as previously reported. Plate growth at 100-150 mV is significantly more rapid than at 40 mV. Plate growth at 0 and 5 mV is not catastrophically rapid, and is significantly lower than at 150 mV. Plate growth at the traditionally 'forbidden region' of 20 mV is actually equivalent to growth at 80 mV, which has universally been considered the optimal float value. It is concluded that the present findings could significantly affect usage in modern telecommunication, utility, and UPS (uninterruptible power supply) installations.<>
正极化对栅格生长、细胞性能和寿命的影响——20年后威廉甘茨重访
使用超声波反射技术来测量栅格的生长,精心制作的铅酸通信电池在160华氏度的大范围正极化(0-150 mV)下进行了测试。结果表明,最小的板生长发生在40 mV,而不是之前报道的70-80 mV。在100-150 mV时,板的生长速度明显快于在40 mV时。在0和5 mV下,板的生长并不是非常快,而且明显低于150 mV。板在传统的“禁区”20mv的增长实际上相当于在80mv的增长,这被普遍认为是最佳的浮动值。结论是,目前的研究结果可能会显著影响现代电信、公用事业和不间断电源装置的使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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