Generalized Thru-Reflect-Line Calibration for the Measurement of Waveguide Devices up to the third Harmonic: First Results

Abstract

The Generalized Reflect Thru Line (GTRL) calibration technique is used for the measurement of a waveguide devices operating in a multioctave band region. In this contribution some preliminary results are shown concerning measurements done up to the third harmonic, where up to four modes are above cutoff.