CMOS integrated antenna-coupled field-effect-transistors for the detection of 0.2 to 4.3 THz

S. Boppel, A. Lisauskas, D. Seliuta, L. Minkevičius, L. Kasalynas, G. Valušis, V. Krozer, H. Roskos
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引用次数: 15

Abstract

Distributed phenomena permit the use of field-effect transistors for the detection of frequencies far beyond transistor cut-off. This contribution gives details on an improved design for patch antenna-coupled field-effect-transistors and shows sensitive detection from 0.2 to 4.3 THz for monolithically integrated devices relying on commercial 0.15-μm CMOS process technology. Room-temperature responsivity values of 1344 V/W at 585 GHz, 90 V/W at 3.1 THz and 11 V/W at 4.3 THz are reported (values acquired at optimum operational point). A minimum optical noise-equivalent-power (NEP) of 163 pW/√Hz at 3.1 THz is reported (All values are normalized to the physical antenna area).
CMOS集成天线耦合场效应晶体管,用于检测0.2至4.3太赫兹
分布现象允许使用场效应晶体管来检测远超过晶体管截止频率的频率。本文详细介绍了贴片天线耦合场效应晶体管的改进设计,并展示了依赖于商用0.15 μm CMOS工艺技术的单片集成器件在0.2至4.3 THz范围内的敏感检测。报告的室温响应度值为585 GHz时的1344 V/W, 3.1太赫兹时的90 V/W和4.3太赫兹时的11 V/W(最佳工作点的值)。3.1太赫兹时最小光噪声等效功率(NEP)为163 pW/√Hz(所有值归一化到物理天线面积)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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