Influence of the current density on CaP coating growth during the US-assisted micro-arc oxidation

E. Kazantseva, E. Komarova
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Abstract

Regularities of the CaP coatings’ thickness and roughness growth with the changing current density during micro-arc oxidation (MAO) process under the external ultrasound (US) were studied. A high-level negative correlation between the thickness or roughness and the current density was observed. This was due to the fact that the current density decreased with time by hyperbolic law and both the thickness and roughness oppositely increased by logarithmic law with time. For the growth rates of the coatings’ thickness and roughness, the direct linear dependencies on the current density were revealed. The decreasing current density with time more affected the increasing coatings’ thickness or roughness and the decreasing growth rates for the control MAO coating thickness and roughness than for the US-assisted MAO coatings.
us辅助微弧氧化过程中电流密度对CaP涂层生长的影响
观察到厚度或粗糙度与电流密度之间存在高度负相关。这是由于电流密度随时间呈双曲规律下降,厚度和粗糙度随时间呈对数规律相反增加。涂层厚度和粗糙度的增长速率与电流密度呈线性关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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