A. Rong, Y. Lu, Kaihua Yuan, Zhonglin Zhang, Luqing Shi
{"title":"Photon-Excited Processes In Nonlinear Optical Materials","authors":"A. Rong, Y. Lu, Kaihua Yuan, Zhonglin Zhang, Luqing Shi","doi":"10.1364/isom.1996.otub.1","DOIUrl":null,"url":null,"abstract":"Traditional reversible order⟺disorder( O,DO ) transformations in recording media of optical memory (OM ) caused by pulsed infrared (IR) laser diode, 830nm, is mainly based on the thermal-induced phase-change (TPC ) processes shown as follows: The overall understanding of the mechanism of TPC OM and rewritable technology has increased steadily over the past few years, but some problems remain. The major unresolved problems are: ( 1 ) Thermal fatigue in recording layer, ( 2 ) Slow response (10~50 ns for recording a bit), and ( 3 ) Imperfection in theory — in which photon-excited processes have not been taken into account.","PeriodicalId":322309,"journal":{"name":"Joint International Symposium on Optical Memory and Optical Data Storage","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Joint International Symposium on Optical Memory and Optical Data Storage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/isom.1996.otub.1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Traditional reversible order⟺disorder( O,DO ) transformations in recording media of optical memory (OM ) caused by pulsed infrared (IR) laser diode, 830nm, is mainly based on the thermal-induced phase-change (TPC ) processes shown as follows: The overall understanding of the mechanism of TPC OM and rewritable technology has increased steadily over the past few years, but some problems remain. The major unresolved problems are: ( 1 ) Thermal fatigue in recording layer, ( 2 ) Slow response (10~50 ns for recording a bit), and ( 3 ) Imperfection in theory — in which photon-excited processes have not been taken into account.