Depth profiling in piezoelectric photoacoustic imaging: theory and experiment

Abstract

The depth profiling of piezoelectric photoacoustic (PA) imaging is studied experimentally and theoretically. In the experiment, the PA signals and the layered PA images of semiconductor materials and devices are obtained by adjusting the phase shift. In order to explain the experimental results, a one-dimensional multilayered model with discontinuous thermal impedance between the neighboring layers is used, and expressions for the thermal and acoustic fields in the sample and PZT transducer are presented. Numerical calculations in agreement with practical experimental conditions have been carried out.<>