One-Port Calibration Methods Applicable to Free-Space Material Measurement

Abstract

Accurate and precise measurement of the scattering parameters of a material under test (MUT) is essential for enhancing the measurement uncertainty of material parameter measurement of the MUT. Two one-port calibration methods applicable to a free-space one-port material measurement are described, and their measurement results are compared with those obtained from the two-port TRL method for a glass plate in W-band.