Intelligent Analysis Framework of Art Measurement Based on Multi-Angle Image Switching Technology

Abstract

This article introduces the related theories of image stitching technology, focusing on the classic scale-invariant feature transform (SIFT) algorithm-based feature detection and description problems, and elaborates its basic theory and feature extraction process; for SIFT's existence during registration Problems such as large amount of calculation and many mismatches. A consistent point shift (CPD) image registration algorithm based on SIFT features is proposed. The general principles of art measurement and the image of template matching algorithm based on art measurement are discussed. Splicing technology and strategies to improve algorithm efficiency.