Measurement setup for linear characterization of a mixed-signal SoC wideband receiver

Abstract

This paper presents a different framework for the characterization and modeling of single-chip mixed-signal system-on-chip (SoC) systems. In this approach a mixed-signal oscilloscope (MSO) in conjunction with external signal generators is used to mix together the information from both analog and digital domains as a way to maintain synchronism between the measured waveforms. The validity of the proposed test bench is then demonstrated by measuring the input analog reflection coefficient and transfer function parameters of a RF-to-digital SoC wideband receiver subsystem.