Multi-failure mode assembly electronic product accelerated test method

Abstract

This paper analyzes the importance of reliability accelerated test. In view of the limitations of current accelerated test of electronic products in multiple failure modes, this paper proposes an accelerated test method of multi-failure mode assembly electronic products based on reliability allocation. The reliability allocation method based on failure modes is presented. At the same time, the design method of accelerated test load spectrum and the calculation method of acceleration factor of assembly electronic products are proposed. Finally, the method proposed has been verified by typical case application.