Magnetic Properties of Fe/Topological Insulator/Fe Multilayer Films and Nano-columns

Faisl Alottebi, P. Seck, S. Karna, D. Seifu
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Abstract

Tri-layer thin films of Ferromagnet (FM)/ Topological Insulator (TI) IFerromagnet (FM) were synthesized using magnetron DC/ RF sputtering with Bi2Te3 and Bi2Se3 topological insulators as middle buffer layers. The multi-layered samples thus produced was studied using in-house built magneto-optic Kerr effect (MOKE) instrument, vibrating sample magnetometer (VSM), torque magnetometer (TMM), atomic and magnetic force microscopy (AFM / MFM), and ferromagnetic resonance (FMR). This system, that is FM/Insulator/FM on MgO (100) substrates, is a tunnel magneto resistance (TMR) structure often used in magnetic tunnel junction (MTJ) devices. The Fe layer and MgO substrate makes the Fe film act like a free standing Fe monolayer weak interaction between the Fe layer and MgO substrate makes the Fe film act like a free-standing layer, with enhanced magnetic moment [1], [2]. TMR effect is a method by which MTJs are used in developing magneto-resistive random access memory (MRAM), magnetic sensors, and novel logic devices. The main purpose behind this research is to measure the magnetic symmetry of Fe/TI/Fe structure and compare and contrast with the magnetic symmetry of multilayer films and nano-columns. In this presentation, we will present results from MOKE, VSM, TMM, AFM/MFM and FMR studies of Fe/TI/Fe.
铁/拓扑绝缘体/铁多层膜和纳米柱的磁性能
以Bi2Te3和Bi2Se3拓扑绝缘体为中间缓冲层,采用磁控DC/ RF溅射法制备了铁磁体(FM)/拓扑绝缘体(TI)三层薄膜。利用自制的磁光克尔效应(MOKE)仪器、振动样品磁强计(VSM)、扭矩磁强计(TMM)、原子磁力显微镜(AFM / MFM)和铁磁共振(FMR)对制备的多层样品进行了研究。MgO(100)基板上的调频/绝缘子/调频系统是一种隧道磁阻(TMR)结构,常用于磁隧道结(MTJ)器件。Fe层与MgO衬底之间的弱相互作用使Fe膜表现为独立的Fe单层,磁矩增强[1],[2]。TMR效应是一种利用MTJs开发磁阻随机存取存储器(MRAM)、磁传感器和新型逻辑器件的方法。本研究的主要目的是测量Fe/TI/Fe结构的磁对称性,并与多层膜和纳米柱的磁对称性进行比较和对比。在本报告中,我们将介绍Fe/TI/Fe的MOKE, VSM, TMM, AFM/MFM和FMR研究结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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